CyberOptics Presents Best Known Measurement Methods in Semiconductor Manufacturing Environments at CS ManTech

AMS

Company discusses most effective ways to improve yield and tool uptimes using high precision measurement devices.

CyberOptics will present at the CS ManTech Conference, the industry’s most important event centered around compound semiconductor processing, testing, design and applications at the Hyatt Regency in Miami, Florida on May 17 at 6:05 p.m. The company will also have an exhibit featuring the WaferSense® wireless measurement portfolio in booth # 510 during the conference May 16 – 19.

CS ManTech’s mission is to foster communication between industry, academia, and government. Three of their key goals include facilitating technical cooperation within the compound semiconductor industry through discussions on semiconductor manufacturing technology problems, helping advance manufacturing capabilities and to establish and maintain credible, high professional standards for the industry. At the conference, Allyn Jackson, Field Applications Engineer and Director of Sales for U.S and Europe at CyberOptics, will present “Best Practices for Measurements in Semiconductor Environments.”

“Legacy measurement methods are not real-time, can be complicated or inefficient, and can be costly when tools need to be taken offline for various processes,” said Allyn Jackson, “The use of high precision, wireless measurement devices can significantly increase yields and tool uptime in semiconductor environments.”

Auto Multi Sensors (AMS)

Solutions reviewed in the case study will include CyberOptics’ Airborne Particle Sensors (APS2) which are widely adopted by semiconductor fabs and equipment OEMs worldwide to wirelessly monitor airborne particles, and its recently launched and rapidly adopted, Auto Multi Sensors (AMS) which easily capture relative humidity (RH), vibration and leveling measurements – all in real-time.

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