Wafer Mapping Sensors & Frame Grabbers
Move Over Through-Beam. Our Wafer Mapping Sensors Offer the Quickest and Most Reliable Off-The-Shelf Wafer Detection.
When it comes to wafer detection, our off-the-shelf mapping sensors surpass through-beam technology in ease of application and safe, maintenance free operation. Our wafer mapping sensors have the detection sensitivity necessary to detect dark and/or thin wafers.
Our wafer mappings sensors provide the best technology for the detection of semiconductor wafers and slotting errors in cassettes and FOUPs. They easily detect thin and dark coated wafers of any size and have no moving parts to keep aligned and/or result in particulate contamination.
Advanced optical technology delivers consistent apparent wafer thickness resulting in performance previously only thought possible with through-beam sensors.
A Dramatic Step Forward in Wafer Detection
Good Things Do Come In Small Packages