CyberCMM™, a comprehensive software suite of coordinate measurement tools provides highly accurate, 100% metrology-grade measurement on all critical points much faster than a traditional CMM, including coplanarity, distance, height and datum X, Y to name a few. A fast and easy set-up can be performed in less than an hour for programming complex applications as compared to slow, engineering resource-intensive set-up that typically requires multiple adjustments with traditional coordinate measurement machines (CMM) s.
Fast and highly accurate with repeatable and reproducible measurements for Metrology, Semiconductor, Microelectronics and SMT applications.
- Fastest – Seconds, not Hours
- Significantly speeds attaining coordinate measurements vs. traditional CMMs
- Reduces engineering resource time
- Easy-to-use Interface
- Simplifies process with award-winning, intuitive, touch screen experience
- Quick programming for complex applications
- Multi-process capable – AOI, SPI, AOM, CMM
- Metrology-grade Accuracy
- Achieve metrology-grade accuracy with MRS-enabled technology
- Repeatable and reproducible measurements for metrology, semiconductor, microelectronics and SMT applications.
- Line / Distance / X,Y / Mid Line
- Inter Point / Regression Shifted
- Datum X,Y / LSF X,Y Offset
- X,Y Offset / Value / Location / List of X,Y Values
- Height / Local Height / Regression / Radius
- Coplanarity / Distance to plane / 2nd Order fitting
- Difference / Absolute / 2sqrt / VC
- Max / Min / Ave / Sigma / Plus / Minus / Multiply
- SQ3000 3D CMM Brochure (PDF)