Updates


New QX200i™ AOI System Receives Award at NEPCON China 2016

NEPCON China Award 2016

CyberOptics Nepcon China 2016

We’re excited to announce the new QX200i™ Double Sided AOI System was recently presented with the SMTA China East Best Emerging Exhibit of the Year Award at NEPCON China 2016.

CyberOptics Nepcon China 2016

CyberOptics’ Eugene Sitoh and Sean Langbridge accepted the award in Shanghai, China.

About the QX250i™/QX200i™ AOI System

The QX250i™ AOI system offers fast, flexible and high performance inspection for all applications and is ideally suited for pre-reflow and selective solder inspection. The top and bottom high-resolution Strobed Inspection Modules (SIMs) with enhanced illumination, provide a single platform for the inspection and defect review process that shortens the production line and drives ~50% productivity improvement.

AI² (Autonomous Image Interpretation) technology in the QX250i™ ensures ultrafast programming and is capable of getting you from zero to production ready in less than 13 minutes*. Powered by an 80 megapixel sensor, QX250i™ significantly improves solder joint and 01005 inspection performance and provides crisp images for more accurate defect review.
Learn about the new and exciting QX250i AOI System >>

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05. 09. 18

CyberOptics will lead a poster presentation during the Technical Exhibition at the European Mask and Lithography Conference (EMLC), June 19-20 in Grenoble, France.

05. 08. 18

CyberOptics will demonstrate the MRS-Enabled SQ3000 with multi-process capabilities including 3D AOI, SPI and CMM applications at SMT Nuremberg, Germany, June 5-7 at the Messe GmbH in hall 4, stand 101.

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