New QX200i™ AOI System Receives Award at NEPCON China 2016
CyberOptics’ Eugene Sitoh and Sean Langbridge accepted the award in Shanghai, China.
About the QX250i™/QX200i™ AOI System
The QX250i™ AOI system offers fast, flexible and high performance inspection for all applications and is ideally suited for pre-reflow and selective solder inspection. The top and bottom high-resolution Strobed Inspection Modules (SIMs) with enhanced illumination, provide a single platform for the inspection and defect review process that shortens the production line and drives ~50% productivity improvement.
AI² (Autonomous Image Interpretation) technology in the QX250i™ ensures ultrafast programming and is capable of getting you from zero to production ready in less than 13 minutes*. Powered by an 80 megapixel sensor, QX250i™ significantly improves solder joint and 01005 inspection performance and provides crisp images for more accurate defect review.
Learn about the new and exciting QX250i AOI System >>