New QX200i™ AOI System Receives Award at NEPCON China 2016

NEPCON China Award 2016

CyberOptics Nepcon China 2016

We’re excited to announce the new QX200i™ Double Sided AOI System was recently presented with the SMTA China East Best Emerging Exhibit of the Year Award at NEPCON China 2016.

CyberOptics Nepcon China 2016

CyberOptics’ Eugene Sitoh and Sean Langbridge accepted the award in Shanghai, China.

About the QX250i™/QX200i™ AOI System

The QX250i™ AOI system offers fast, flexible and high performance inspection for all applications and is ideally suited for pre-reflow and selective solder inspection. The top and bottom high-resolution Strobed Inspection Modules (SIMs) with enhanced illumination, provide a single platform for the inspection and defect review process that shortens the production line and drives ~50% productivity improvement.

AI² (Autonomous Image Interpretation) technology in the QX250i™ ensures ultrafast programming and is capable of getting you from zero to production ready in less than 13 minutes*. Powered by an 80 megapixel sensor, QX250i™ significantly improves solder joint and 01005 inspection performance and provides crisp images for more accurate defect review.
Learn about the new and exciting QX250i AOI System >>

Recent Posts

Upcoming Events

Press Releases

12. 02. 15

CyberOptics will demonstrate the WaferSense® and ReticleSense® APS2 technology at Semicon Japan at Tokyo Big Sight, December 16th – 18th in booth #4804.

11. 17. 15

CyberOptics announced that it received a follow-on order valued at approximately $750,000 for SQ3000 automated optical inspection systems, based upon the company’s 3D Multi-Reflection Suppression (MRS) inspection technology platform. This 3D AOI order is scheduled to ship in this year’s fourth quarter.

Subscribe to our Newsletters

Sign up to receive the latest industry news and topics on semiconductor and inspection system products.


Privacy Policy Email marketing by Interspire


Privacy Policy Email marketing by Interspire