Interview with Dr. Subodh Kulkarni During Semicon West 2015
Semicon West 2015: Progress Against Company Strategy
Dr. Subodh Kulkarni, President and CEO of CyberOptics, was interviewed during the Semicon West 2015 conference about the progress made against the company’s 3D High Precision Sensor strategy. In the video, he shares the exciting developments with the proprietary 3D Multi-Reflection Suppression (MRS) sensor technology in the 3D AOI inspection, the back-end semiconductor market and the 3D scanning and solutions markets.
The advanced Multi-Reflection Suppression (MRS) Technology is incorporated into the new 3D SQ3000 Automated Optical Inspection (AOI) system enabling metrology-grade accuracy at production speeds. Right now, the market is shifting to 3D inspection vs. 2D inspection, which creates a critical need for highly accurate inspection, particularly with shiny parts. Customer interest and adoption continues to build.
Having the MRS sensor integrated into KLA-Tencor’s back-end inspection system is a testament to the capabilities of the technology for precision inspection. For the 3D scanning market, the company will be launching the CyberGage 360. This product is incredibly simple to use and provides exceptional accuracy. Users simply put the item into the machine, press a button and a highly accurate 3D scan is quickly generated. Mitigating reflections is also important in 3D scanning, so the MRS technology holds a key competitive advantage.
At the show, CyberOptics unveiled a new WaferSense and ReticleSense Auto Multi Sensor (AMS) for leveling, vibration and humidity measurement that garnered a lot of attention from various key semiconductor customers. Comments often heard included:
- “It’s so thin, it’s so light!”
- “The all-in-one capability makes it so easy for multiple applications – it will save me a lot of time.”
- “The new humidity measurement is a key add that we really need.”