Applications by Product

Semiconductor Processes and Groups Where WaferSense and ReticleSense Measurement Devices Are Used


Atomic Layer Deposition - ALD

Automated Handling Systems - AMHS

Chemical Vapor Deposition CVD, ALD

CMP

Diffusion / Furnace

Dry Etch

Epitaxy

Ion Implant

Metrology

Micro Contamination

Module Repair

Photo Lithography

Plasma Vapor Deposition - PVD

Rapid Thermal Anneal - RTA, RTP

Test & Inspection

Thermal Oxidation / Metalization

Wet (Chemical) Etching / Plasma Etch